Distinguished Talk 05: ADC Performance Limits - The Fundamentals

Distinguished Talk 05: ADC Performance Limits - The Fundamentals by prof. Dr. Marcel Pelgrom (TU Delft).
Abstract:
Any performance metric for analog-to-digital converters contains at least the parameters: power, effective resolution and bandwidth. Finding the right balance for a given application between these parameters is the main task of the ADC designer. Ultimately the boundaries on ADC performance are set by some fundamental parameters: thermal noise, jitter and variability. The choice of the conversion architecture allows shifting between some characteristics, but in all realizations pushing these boundaries requires spending more power. This talk reviews some developments in variability and jitter for AD conversion and discusses the influence of advanced technology options.
Short CV:
Marcel Pelgrom received his PhD from Twente University, Enschede, The Netherlands. In 1979, he joined Philips Research Laboratories, where his research has covered topics such as charge coupled devices, MOS matching properties, analog-to-digital conversion, digital image correlation, and various analog building block techniques. He has headed several project teams and was a team leader for high-speed analog-to-digital conversion. From 1996 until 2003, he was a department head for mixed-signal electronics. In addition to various activities concerning industry-academic relations, he was a Philips Research Fellow working on the edge of design and technology. In 2003, he spent a sabbatical in Stanford University where he served as a consulting professor and in 2014 as a lecturer. From 2006 until 2013, he has been a member of the technical staff at NXP Semiconductors. Dr. Pelgrom was twice an IEEE Distinguished Lecturer and has written three books on ADCs, over 40 publications and seven book chapters, and he holds 37 US patents. He currently consults industry and lectures at Delft University and Twente University and for MEAD Inc. He was appointed as an honorary professor at the KU Leuven and he is the 2017 recipient of the Gustav R. Kirchhoff IEEE field award.