Scanning Transmission Electron Microscopy (STEM) in SEM

With the advances in scanning electron microscopy (SEM) resolution, transmission experiments have become a viable option in the SEM. While not able to reach the resolution of dedicated scanning transmission electron microscope (STEM), the SEM can achieve sub-nanometer resolution. The insertable STEM detectors in the SEM are versatile with configurations for annular detector or multiple concentric rings covering the range from bright field, dark field, and high-angle annular dark field simultaneously. The STEM in SEM setup has many applications ranging from screening samples for higher resolution TEM work, high throughput STEM work, and even in-situ capabilities of looking at hydrated samples using a WetSTEM stage in environmental mode. In this session of our "Beyond the Scope: CEMAS Discussion Series," we will go over the basics of STEM theory, discuss the technology enabling STEM in the SEM, and show some examples of how STEM in the SEM has been used across different applications.

[@tareknagla3141]

Excellent

[@manishborse2798]

Hello, thank you. This is very important information. I have captured some dislocation in SEM_STEM with a very good constant than TEM. Could you please provide some insights into why we can see dislocations easily in STEM mode?
Also, what exactly does STEM3+ mode do? It's stopping the least scattered electron (BF); what does the Blue ring indicate?

[@lee-dx3oz]

Good presentation ^^

[@ricardomiranda3059]

pretty interesting

[@elisbansacari5348]

hello nice presentation, were can I find the ppt or pdf presentation? can you share that, thank you so much.