Metal-In Test-Driven Development: A Dual-Target TDD approach - Fran Climent - NDC TechTown 2024

This talk was recorded at NDC TechTown in Kongsberg, Norway. #ndctechtown #ndcconferences #developer #softwaredeveloper
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How can we get rid of the hardware bottleneck in order to speed up our embedded development processes? Could we treat our embedded code as a complete subsystem decoupled from the underlying hardware? If yes, how could we achieve it?
In this workshop I will show by means of an 'easy' example (Kata) how this can be achieved following a "Metal-In" TDD approach, which can be seen as a Dual-Target TDD specific implementation. This approach is aimed, among other things, to minimize how much hardware gets involved in our embedded code development workflow.
We will first touch the metal, facing its cold truth, till we finally Make-It-Work. Later, we will drive our code 'In', Making-It-Right (enough), while creating our own decoupled and portable entities and business domain model. We will do it safely, iteratively and incrementally,
Specifically we will:
• Develop a highly decoupled and portable ‘BatteryMonitor’
module following Metal-In TDD approach.
• Highlight the differences between the Make-It-Work phase
(TDD’s Red to Green phases) and the Make-It-Right (TDD’s
Refactor phase)
• Use state of-the-art automated refactoring tools available for
C/C++