Test & Repair of SoCs for Functional Safety Applications | Synopsys

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  • เผยแพร่เมื่อ 20 ก.ค. 2024
  • This webinar will discuss the implications of automotive test, reliability and functional safety requirements on all aspects of the SoC lifecycle: design, silicon bring up, volume production, and in-the-field power-on self-test (POST). We will also discuss the automotive safety-critical designs that may need periodic in-system self-test and error correction. We will show solutions that help create functionally safe ICs and SoCs, including special embedded test and repair capabilities leveraged from manufacturing to mission mode; advanced error correcting codes (ECC) to detect and correct multi-bit upsets during in-system operation; process and clock monitoring, and fault injection for comprehensive silicon debug.
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