Complex Safety Mechanisms Require Interoperability for Validation and Final Metrics

Presented at DVCon U.S. 2023
Protecting Safety and Security Session
By: Daeseou Cha, Samsung; Vedant Garg, Siemens EDA; Ann Keffer, Siemens EDA; James Kim, Siemens EDA; Woojoo Space Kim, Samsung Electronics
dvcon.org
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