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Is the semiconductor industry still using low force of contact profilometers or optical profilometry is preferred because its no contact?
Both are used. Specific stylii of very small radius can sometimes reach a better resolution than optical profilers.
Is the semiconductor industry still using low force of contact profilometers or optical profilometry is preferred because its no contact?
Both are used. Specific stylii of very small radius can sometimes reach a better resolution than optical profilers.