IEEE Std. 1149.1: advantages and applications of boundary-scan

Presentation by JTAG Technologies' MD Peter van den Eijnden for GlobalSpec. Peter explains the basics of boundary-scan testing and the advantages of boundary-scan above a.o. traditional probe testing, especially for miniature electronics. He then elaborates on some of the different applications of boundary-scan technology and the advantages of using the IEEE 1149.1 standard. After the presentation Peter answers some of the live viewers' questions.
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