He Felix: I did an entire video on quantitative EDS you can find here: th-cam.com/video/H5HA9K3eRlo/w-d-xo.htmlsi=_xstIhUyQUJEIWBW Doing EDS quantification through Velox is essentially a "black box" calculation, so I tend to take those results with a grain of salt. That being said, there isn't much to doing EDS quantification in Velox; you simply select elements, select peaks, add in absorption correction (or not), and then compute the result. It would be short video, but definitely one that could be useful for some people who rely on Velox for these results.
Great video !!!! I wonder to know...in case if I don't have aberration corrector for stem mode is it possible to get atomically resolved EDS map (we have image corrector on our FEI Themis microscope) ? Thanks a lot for your videos !
Thank you! Yes, it is indeed possible (though not as easy) to get atomic resolution EDS from a non-corrected instrument. In fact, the first time atomic resolution EDS was demonstrated, it was on a non-corrected instrument (though the data certainly wasn't very good). On modern non-corrected systems that are very stable with very good EDS systems, I think this can actually be done somewhat routinely and the results are rather impressive (though again, not as impressive as with a corrected instrument).
Thanks for nice video! You may show also extraction of the line scan profile- it is more correct from the analysis point. How you perform the micro-prob tuning? Only what you had shown or there's more alignments?
Hi Sergei: You're welcome; you don't need to perform any "tuning" when using microprobe mode like when you are in nanoprobe mode. The reason for this is the small convergence angles used in microprobe mode. The corrector tuning is only needed when the convergence angles are much larger. I could have also done the beam tilt pivot points as part of the microprobe STEM alignment, but this isn't really critical. Aside from that, there isn't much else you need to do beyond what I showed to get the best performance as it is not really a "high resolution" imaging mode.
Great question; I'm not exactly sure, but it may be related to the scanning pattern used by the probe. Somehow, this is resulting in the probe briefly pausing at the right side of the analysis area as it is scanned from left to right. This is somewhat speculative, but I do know from experience that a stationary probe always causes more damage than a moving probe, since the moving probe isn't continuously hitting one spot.
Excellent job! Very easy to follow but also informative.
Thank you; it's just a shame I ran out of drift correction!
thank you,great video. Dr. Nicholas,can you demo EDS quantification by Velox app in future video?
He Felix: I did an entire video on quantitative EDS you can find here:
th-cam.com/video/H5HA9K3eRlo/w-d-xo.htmlsi=_xstIhUyQUJEIWBW
Doing EDS quantification through Velox is essentially a "black box" calculation, so I tend to take those results with a grain of salt. That being said, there isn't much to doing EDS quantification in Velox; you simply select elements, select peaks, add in absorption correction (or not), and then compute the result. It would be short video, but definitely one that could be useful for some people who rely on Velox for these results.
Great video !!!! I wonder to know...in case if I don't have aberration corrector for stem mode is it possible to get atomically resolved EDS map (we have image corrector on our FEI Themis microscope) ? Thanks a lot for your videos !
Thank you! Yes, it is indeed possible (though not as easy) to get atomic resolution EDS from a non-corrected instrument. In fact, the first time atomic resolution EDS was demonstrated, it was on a non-corrected instrument (though the data certainly wasn't very good). On modern non-corrected systems that are very stable with very good EDS systems, I think this can actually be done somewhat routinely and the results are rather impressive (though again, not as impressive as with a corrected instrument).
Thanks for nice video!
You may show also extraction of the line scan profile- it is more correct from the analysis point.
How you perform the micro-prob tuning? Only what you had shown or there's more alignments?
Hi Sergei: You're welcome; you don't need to perform any "tuning" when using microprobe mode like when you are in nanoprobe mode. The reason for this is the small convergence angles used in microprobe mode. The corrector tuning is only needed when the convergence angles are much larger. I could have also done the beam tilt pivot points as part of the microprobe STEM alignment, but this isn't really critical. Aside from that, there isn't much else you need to do beyond what I showed to get the best performance as it is not really a "high resolution" imaging mode.
Is there a specific reason why the specimen gets damaged from its right region during EDS mapping or EELS SI?
Great question; I'm not exactly sure, but it may be related to the scanning pattern used by the probe. Somehow, this is resulting in the probe briefly pausing at the right side of the analysis area as it is scanned from left to right. This is somewhat speculative, but I do know from experience that a stationary probe always causes more damage than a moving probe, since the moving probe isn't continuously hitting one spot.