After Café: Spectroscopic Methods for Electronic Property Characterization

In this co-presentation, Jeff Shallenberger, a research faculty, MCL Associate Director, and Manager of Surface Analysis, and Maxwell Wetherington, Assistant Research Professor specializing in Molecular Spectroscopy at the Materials Research Institute, Penn State, speak on the topic, "Spectroscopic Methods for Electronic Property Characterization at the MCL." This talk introduces how MCL now offers a range of analytical techniques that can be used to determine the key electronic properties of your device or material system. These properties include band gap (Eg), work function (WF), valence band maximum (VBM), ionization energy (IE), electron affinity (EA), conduction band minimum (CBM), and carrier concentration. We have techniques for studying electronic defect states in the band gap which can impact device performance and for those making heterojunctions, we can determine valence and conduction band offsets. This talk will provide an overview of these parameters, how they can be measured within MCL, and details about sample requirements and limitations.
The weekly After Cafés are 30-minute talks about the Penn State MCL's analytical capabilities.
To learn more about MCL capabilities please contact [e-mail].
Subscribe to the Penn State MRI channel for more videos:
/ pennstatemri
TH-cam Playlist for the After Café Series I:
• After Café Series I: M...
TH-cam Playlist for the After Café Series II:
• After Café Series II: ...
After Café:
www.mri.psu.ed...
Materials Characterization Lab
www.mri.psu.ed...
Materials Characterization Techniques
www.mri.psu.ed...
FOLLOW US:
LinkedIn: /in/PennStateMRI
TH-cam: /c/PennStateMRI
Instagram: @PennStateMRI
Twitter: @PennStateMRI
Subscribe to our mailings: www.mri.psu.ed...
Penn State Materials Research Institute
www.mri.psu.edu/

[@AbdurRahim-tp7rw]

good job