Model-Based Characterization: Tracing Design Characteristics in Enterprise using QIF and UUIDs

George Rendell, VP NX Design Product Management and Product Marketing at Siemens Digital Industries Software and Daniel Campbell, VP MBD at Capvidia, presents "Model-Based Characterization: Tracing Design Characteristics throughout the Enterprise using QIF and UUIDs” at MBE and QIF Summit Day 3.
You will learn how QIF standards and Unique Universal Identifiers (UUIDs) bridge data gaps in large-scale manufacturing by creating a "digital thread."
Through connecting design tools (NX CAD) to manufacturing and quality control (Capvidia MBDVidia and Hexagon PC DMIS), you can transform your operations for greater efficiency, quality and competitiveness.

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METROLOGY - en.wikipedia.org/wiki/Metrology 😎