X-Ray Technologies - X-Ray Reflectivity, Sample Alignment, Thickness-Roughness-Density of Thin Films
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- เผยแพร่เมื่อ 4 ต.ค. 2024
- This video contains an online lecture on X-Ray Reflectivity as a part of PHYS 515 - X-Ray Technologies course. The lecture is given by Prof. Dr. Numan Akdoğan for the students of Gebze Technical University.
In the 2020 spring semester, the first four chapters of PHYS 515 - X Ray Technologies were held face-to-face in the classroom. However, after COVID-19 became a pandemic, the course continued online.
17.04.2020
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Very clear and easy to follow. Thank you Dr. Numan
You are welcome. Best wishes.
Thanks for your detailed demonstration, especially for your own schematic and the animation in alignment part.
Thank you for your nice comment.
Thank you so much sir i have prepared my presentation on xrr experimental technique by listening your video and i got good marks just because of you.
You are welcome.
@@numan.akdogan sir if i use the same graph to compare electron densities of the different elements just to write review summary as example of use of xrr technique then what references can i use?
@@farwaangel3648 Dear Farwa. You can use the theoretical relation between the critical angle and electron density as a reference, which is also discussed in the lecture. In addition, you can find some XRR information in internet, if search the online publications of Rigaku company.
@@farwaangel3648 The Rigaku Journal, 26(2), 2010
@@numan.akdogan thanku so much sir.
Brilliant! Thank you!
Thanks Prof. for your detailed description on XRR. Really, its a very informative stuff. I want to know how we get information about in plane and out plane stress using XRD/
Dear anJali Chodhre. By using XRD you can measure the lattice expansion or lattice shrinking in your sample. You can find the relavant information in the XRD lectures provided in the following link.
th-cam.com/play/PL0vY-WY2lvfagv7Q1im8iWPqeVJ9HStwf.html
@@numan.akdogan
Thanks Professor for your quick response.
I want to know one more thing, why fringes are separated along qy axis in RSM, why not along qx?. What is the significance of this?
Dear@@anjalichaudhary5491. You can find the detailed information about reciprocal space mapping (RSM) in the following article. Best wishes.
www.tandfonline.com/doi/abs/10.1080/10408439708241259?journalCode=bsms20
@@numan.akdogan thank you 😊
@@anjalichaudhary5491 You are welcome.
Thank you professor. It is very nice class.
Could you please make more video on XRR analysis of multilayer examples. Best regards.
Dear Wu. Thank you for your nice comment. For more information on XRR of multilayers I can recommend the booklet of Rigaku. I think you can find it for free on the internet.
@@numan.akdogan Thank you very much for your suggestion. It is my honor to watch your video.
Thank you for such a nice demonstration.
But I have one question. Can we calculate the density of thin-film from any other technique?
thanks.
You're welcome. XRR is very useful in nanometer scale. Especially for multilayered thin films. If you are an expert, you can achieve good results even in the angstrom range. Unfortunately, I don't know a better method.
Dear Sir, Thank you very much for the nice lecture and the details. I wanna to ask you, during measurement how the detector can distinguish beteween XRR and GIXRD since both are made at low incidence angles?
Dear Nabil. Detector reads the intensity coming from the sample. The position of the detector is defined by a computer-controlled goniometer.
Please make the slides in English version. Although lecture is good. Thanks
Maybe next time. Thank you for your interest.
English version of the slides. th-cam.com/video/ndzaA9AmI9M/w-d-xo.html
@@numan.akdogan thank you
@@shahzadahmed5012 You are welcome.
Dear sir, why the data was taken in half cut positions?? What is the role of half cut of the x ray beam during alignment and also during measurement??
Hello Saugata Roy. This allows to direct the x-ray to the very center of the sample. You can also try this at home with a laser pointer. You can observe what happens if you cut the beam completely or allow it completely.
Thanks 😁😁
You are welcome.
Dear professor, May i have your email address, please? I made an xrr data for a supperlattice structure, could you please help me to figure out how to analysis the interface roughness?
Dear Wu. My e-mail address is: akdogan@gtu.edu.tr
Please include in your e-mail the name of the program you use to simulate your XRR data. Best wishes.
You can watch the video with English slides from the link below.
th-cam.com/video/ndzaA9AmI9M/w-d-xo.html
Hocam türkçe anlatımınız da var mı acaba ?
Merhaba. Bu dersi GTÜ'de İngilizce olarak anlatıyorum. Belki ileride bir yaz okulunda veya seminerde Türkçe olarak anlatırsam o kayıtları da burada paylaşmaya çalışırım inşallah.
@@numan.akdogan Hocam ben polimer malzemeyi belirli zamanlarda -175 derece soğuttum. Soğutma işlemi yapmadığım aynı polimer ile XRD uyguladım.
1- Bazı açılarda pikler oluyor . Bu pikler neden bazı açılarda yükselirken bazı açılarda stabil kalıyor.
2- Soğuttuğum malzemelerde pik noktları, oda sıcaklığına göre farklı açılarda pik yaptığını görüyorum. Neden açı bölgelerinde değişiklik olmuş olabilir.
Zahmet olmazsa cevaplayabilirseniz sevinirim hocam.
@@mekanikbeyin615 Merhaba. Bir XRD ölçümünü analiz ederken her zaman iki (2) bilgiyi hatırlamak gerekir. Birincisi "intensity", yani pik şiddetidir. Hangi pikte detektöre ne kadar foton gitmiş onu gösterir. İkincisi de Bragg yasasıdır (n.Lambda=2dsintheta).
Senin ölçümlerinde iki farklı sonuç görmüşsün.
Birincisinde bazı açılardaki piklerin şiddeti artmış. Bunun sebebi o açılarda detektöre giden foton sayısının (intensity) artmasıdır. Bu da o piklere ait kristal yönelimlerinin malzeme içerisinde arttığını ve/veya o yönelime ait kristallerin daha iyi kristal hâle geldiğini gösterir.
İkinci sorunda; malzemeyi soğuttuğunda piklerin farklı açılarda çıkmasının sebebini Bragg yasasıyla kolaylıkla analiz edebilirsin. Aynı XRD cihazını kullanıyorsan Bragg yasasının sol tarafı sabittir (n.Lambda=2dsintheta). Denklemin sağ tarafında "sintheta" var. Senin ölçümlerinde soğutma işleminden sonra theta açısı yani pikin yeri değişmiş. Bu da soğutma işleminden sonra düzlemler arası "d" mesafesinin değiştiğini gösterir. Pikler sağa kaydıysa theta artar ve d azalır (lattice shrinking). Pikler sola kaydıysa theta azalır ve d artar (lattice expansion). Soğutma işlemine bağlı olarak malzemenin kristal yapısında değişimler meydana gelmiş. Bu değişim lattice expansion veya lattice shrinkingten kaynaklanmış olabilir.
Yukarıdaki bilgileri kullanarak sonuçlarını analiz edebilirsin.
@@numan.akdogan Çok teşekkür ederim Sayın Hocam bilgiler için.
@@mekanikbeyin615 Rica ederim. Kolay gelsin.