FISCHERSCOPE X-RAY XDV-μ SEMI | Automated measurement of wafer microstructures | Fischer

Designed for quality control in the semiconductor industry, the FISCHERSCOPE® X-RAY XDV®-μ SEMI accurately measures microstructures on wafers - fully automatically.
The whole automation unit is enclosed and therefore perfectly suited for use in clean rooms. FOUP and SMIF pods can be automatically docked to the measuring system. The handling and measurement inside the XDV-μ SEMI takes place entirely without manual intervention. Thanks to pattern recognition, the X-RAY locates the specified measuring positions precisely and reliably. This automatic measuring process rules out damage and contamination caused by manual handling and ensures high throughput rates for inspecting valuable wafers.
More about our FISCHERSCOPE® X-RAY XDV®-µ: www.helmut-fis... 📍
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