Preparing APT specimens in a controlled environment

In this recorded live webinar, we present sample preparation and analyses workflow under controlled environments using broad Ar ion beam milling and Ga FIB, followed by concentrated Ar ion beam milling of metallic Mg APT specimens. Using Ar ion milling techniques (Model 1062 TrionMill and Model 1040 NanoMill® TEM specimen preparation system) on the bulk and APT specimens, surface damage and oxidation can be completely removed or reduced by specimen preparation under controlled environments.