Measuring the Spring Constant of a Nano Platinum Pillar Using AFM and SEM in FusionScope®

Quantum Design's Vice President of Strategy and Innovation, Stefano Spagna, explores the advanced capabilities of FusionScope's AFM-SEM correlative microscopy and highlights how FusionScope's Profile View simplifies the measurement of spring constants in nanostructures. Capturing measurements of a "nano" platinum pillar printed on a silicon surface using Focus Electron Beam-Induced Deposition (FEBID) demands nanometer accuracy for precise alignment. FusionScope excels by enabling simultaneous observation and alignment of both the AFM tip and the pillar, ensuring accurate and efficient measurements. Visit fusionscope.com to learn more.